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W-Sb-Te phase-change material: A candidate for the trade-off between programming speed and data retention

  • Cheng Peng*
  • , Liangcai Wu
  • , Feng Rao
  • , Zhitang Song
  • , Pingxiong Yang
  • , Hongjia Song
  • , Kun Ren
  • , Xilin Zhou
  • , Min Zhu
  • , Bo Liu
  • , Junhao Chu
  • *此作品的通讯作者
  • East China Normal University
  • CAS - Shanghai Institute of Microsystem and Information Technology

科研成果: 期刊稿件文章同行评审

摘要

W-Sb-Te phase-change material has been proposed to improve the performance of phase-change memory (PCM). Crystallization temperature, crystalline resistance, and 10-year data retention of Sb 2Te increase markedly by W doping. The W x(Sb 2Te) 1-x films crystallize quickly into a stable hexagonal phase with W uniformly distributing in the crystal lattice, which ensures faster SET speed and better operation stability for the application in practical device. PCM device based on W 0.07(Sb 2Te) 0.93 shows ultrafast SET operation (6 ns) and good endurance (1.8 × 10 5 cycles). W-Sb-Te material is a promising candidate for the trade-off between programming speed and data retention.

源语言英语
文章编号122108
期刊Applied Physics Letters
101
12
DOI
出版状态已出版 - 17 9月 2012

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