@inproceedings{ceb0c699332449c5be059c9118244768,
title = "Voltage-controlled change of MIS reflectivity in visible and near infrared band",
abstract = "Voltage-induced reflective changes of Pt/BLT/Si and Pt/STO/Si are investigated in visible and near infrared band. A theoretic calculation of inversion layer plasmons is set up. The most sensitive optical band and the voltage value interval causing fastest change rate are indicated. Some variance regularities are described, and this study provides the basically theoretical support for the application of an optical readout infrared imaging device: MFIS.",
keywords = "MIS, Plasmon, Reflectivity change",
author = "Qin, \{J. H.\} and Ma, \{J. H.\} and Huang, \{Z. M.\} and Chu, \{J. H.\}",
year = "2008",
doi = "10.1117/12.792118",
language = "英语",
isbn = "9780819471826",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
booktitle = "Sixth International Conference on Thin Film Physics and Applications",
note = "6th International Conference on Thin Film Physics and Applications, TFPA 2007 ; Conference date: 25-09-2007 Through 28-09-2007",
}