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Tuning of the metal-insulator transition in electrolyte-gated NdNiO 3 thin films

  • S. Asanuma
  • , P. H. Xiang
  • , H. Yamada
  • , H. Sato
  • , I. H. Inoue
  • , H. Akoh
  • , A. Sawa*
  • , K. Ueno
  • , H. Shimotani
  • , H. Yuan
  • , M. Kawasaki
  • , Y. Iwasa
  • *此作品的通讯作者
  • National Institute of Advanced Industrial Science and Technology
  • Japan Science and Technology Agency
  • Tohoku University
  • The University of Tokyo
  • RIKEN

科研成果: 期刊稿件 › 文章 › 同行评审

摘要

We demonstrate electrostatic control of the metal-insulator transition in the typical correlated-electron material NdNiO3 through a large effective capacitance of the electric double layer at the electrolyte/NdNiO 3 interface. The metal-insulator transition temperature (TMI) of NdNiO3 is shown to decrease drastically with increasing hole concentration through the application of a negative gate voltage (V G). The shift in TMI (Δ TMI) is larger for thinner NdNiO 3; for VG of -2.5 V, Δ TMI of 5-nm-thick NdNiO3 is as large as 40 K, and the resistivity change near 95 K is one order of magnitude. This study may be potentially applicable to Mott transistor devices.

源语言英语
期刊论文编号142110
期刊Applied Physics Letters
卷97
期14
DOI
出版状态已出版 - 4 10月 2010
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