摘要
We demonstrate electrostatic control of the metal-insulator transition in the typical correlated-electron material NdNiO3 through a large effective capacitance of the electric double layer at the electrolyte/NdNiO 3 interface. The metal-insulator transition temperature (TMI) of NdNiO3 is shown to decrease drastically with increasing hole concentration through the application of a negative gate voltage (V G). The shift in TMI (Δ TMI) is larger for thinner NdNiO 3; for VG of -2.5 V, Δ TMI of 5-nm-thick NdNiO3 is as large as 40 K, and the resistivity change near 95 K is one order of magnitude. This study may be potentially applicable to Mott transistor devices.
| 源语言 | 英语 |
|---|---|
| 期刊论文编号 | 142110 |
| 期刊 | Applied Physics Letters |
| 卷 | 97 |
| 期 | 14 |
| DOI | |
| 出版状态 | 已出版 - 4 10月 2010 |
| 已对外发布 | 是 |
学术指纹
探究 'Tuning of the metal-insulator transition in electrolyte-gated NdNiO 3 thin films' 的科研主题。它们共同构成独一无二的学术指纹。引用此
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