跳到主要导航 跳到搜索 跳到主要内容

Transport properties of InAlAs/InGaAs metamorphic high electron mobility transistors on GaAs substrate

  • C. P. Jiang
  • , X. J. Li
  • , S. L. Guo
  • , Q. Sun
  • , Z. M. Huang
  • , J. H. Chu

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Variable magnetic field Hall measurement has been used to investigate the transport properties in InAlAs/InGaAs metamorphic high electron mobility transistors (MMHEMT) on GaAs substrate in the temperature range from 1.5 to 90K. The experimental data have been analyzed by using a hybrid approach consisting of the mobility spectrum (MS) technique followed by a multi-carrier fitting (MCF) procedure. Both the Shubnikov-de Haas measurements and the hybrid MS+MCF approach show two-dimensional electronic behavior. The two-dimensional electrons, with mobility ∼3×104cm2/Vs and a sheet density ∼2.3×1012cm-2, are obtained and come from the quantum well. The temperature dependent evolution of the electron mobility indicates that alloy scattering dominates at higher temperature.

源语言英语
主期刊名2001 6th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2001 - Proceedings
编辑Hiroshi Iwai, Xin-Ping Qu, Bing-Zong Li, Guo-Ping Ru, Paul Yu
出版商Institute of Electrical and Electronics Engineers Inc.
1077-1080
页数4
ISBN(电子版)0780365208, 9780780365209
DOI
出版状态已出版 - 2001
已对外发布
活动6th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2001 - Shanghai, 中国
期限: 22 10月 200125 10月 2001

出版系列

姓名2001 6th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2001 - Proceedings
2

会议

会议6th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2001
国家/地区中国
Shanghai
时期22/10/0125/10/01

指纹

探究 'Transport properties of InAlAs/InGaAs metamorphic high electron mobility transistors on GaAs substrate' 的科研主题。它们共同构成独一无二的指纹。

引用此