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Towards RTL test generation from SystemC TLM specifications

  • Mingsong Chen*
  • , Prabhat Mishra
  • , Dhrubajyoti Kalita
  • *此作品的通讯作者
  • University of Florida
  • Intel

科研成果: 书/报告/会议事项章节 › 会议稿件 › 同行评审

摘要

SystemC Transaction Level Modeling (TLM) is widely used to reduce the overall design and validation effort of complex System-on-Chip (SOC) architectures. Due to lack of efficient techniques, the amount of reuse between abstraction levels is limited in many scenarios such as reuse of TLM level tests for RTL validation. This paper presents a top-down methodology for generation of RTL tests from SystemC TLM specifications. This paper makes two important contributions: automatic test generation from TLM specification using a transition-based coverage metric and automatic translation of TLM tests into RTL tests using a set of transformation rules. Our initial results using a router design demonstrate the usefulness of our approach by capturing various functional errors as well as inconsistencies in the implementation.

源语言英语
主期刊名Proceedings - IEEE International High-Level Design Validation and Test Workshop, HLDVT
页91-96
页数6
DOI
出版状态已出版 - 2007
已对外发布是
活动IEEE International High-Level Design Validation and Test Workshop, HLDVT - Irvine, CA, 美国
期限: 7 11月 2007 → 9 11月 2007

出版系列

姓名Proceedings - IEEE International High-Level Design Validation and Test Workshop, HLDVT
ISSN(印刷版)1552-6674

会议

会议IEEE International High-Level Design Validation and Test Workshop, HLDVT
国家/地区美国
市Irvine, CA
时期7/11/07 → 9/11/07

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