摘要
Developments in semiconductor technology are propelling the dimensions of devices down to 10 nm, but facing great challenges in manufacture at the sub-10 nm scale. Nanotechnology can fabricate nanoribbons from two-dimensional atomic crystals, such as graphene, with widths below the 10 nm threshold, but their geometries and properties have been hard to control at this scale. Here we find that robust ultrafine molybdenum-sulfide ribbons with a uniform width of 0.35 nm can be widely formed between holes created in a MoS2 sheet under electron irradiation. In situ high-resolution transmission electron microscope characterization, combined with first-principles calculations, identifies the sub-1 nm ribbon as a Mo5S4 crystal derived from MoS 2, through a spontaneous phase transition. Further first-principles investigations show that the Mo5S4 ribbon has a band gap of 0.77 eV, a Young's modulus of 300GPa and can demonstrate 9% tensile strain before fracture. The results show a novel top-down route for controllable fabrication of functional building blocks for sub-nanometre electronics.
| 源语言 | 英语 |
|---|---|
| 文章编号 | 1776 |
| 期刊 | Nature Communications |
| 卷 | 4 |
| DOI | |
| 出版状态 | 已出版 - 2013 |
| 已对外发布 | 是 |
指纹
探究 'Top-down fabrication of sub-nanometre semiconducting nanoribbons derived from molybdenum disulfide sheets' 的科研主题。它们共同构成独一无二的指纹。引用此
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