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Thorough subcells diagnosis in a multi-junction solar cell via absolute electroluminescence-efficiency measurements

  • Shaoqiang Chen*
  • , Lin Zhu
  • , Masahiro Yoshita
  • , Toshimitsu Mochizuki
  • , Changsu Kim
  • , Hidefumi Akiyama
  • , Mitsuru Imaizumi
  • , Yoshihiko Kanemitsu
  • *此作品的通讯作者
  • The University of Tokyo
  • National Institute of Advanced Industrial Science and Technology
  • Japan Aerospace Exploration Agency
  • Kyoto University

科研成果: 期刊稿件文章同行评审

摘要

World-wide studies on multi-junction (tandem) solar cells have led to record-breaking improvements in conversion efficiencies year after year. To obtain detailed and proper feedback for solar-cell design and fabrication, it is necessary to establish standard methods for diagnosing subcells in fabricated tandem devices. Here, we propose a potential standard method to quantify the detailed subcell properties of multi-junction solar cells based on absolute measurements of electroluminescence (EL) external quantum efficiency in addition to the conventional solar-cell external-quantum-efficiency measurements. We demonstrate that the absolute-EL-quantum-efficiency measurements provide I-V relations of individual subcells without the need for referencing measured I-V data, which is in stark contrast to previous works. Moreover, our measurements quantify the absolute rates of junction loss, non-radiative loss, radiative loss, and luminescence coupling in the subcells, which constitute the 'balance sheets' of tandem solar cells.

源语言英语
文章编号7836
期刊Scientific Reports
5
DOI
出版状态已出版 - 16 1月 2015

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