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Thickness dependence of electrical properties in poly(vinylidene fluoride trifluoroethylene) copolymer thin films

  • L. Tiana*
  • , S. Z. Yuanb
  • , J. L. Sunc
  • , X. J. Mengd
  • , J. L. Wange
  • , J. Yangf
  • , W. Baig
  • , J. H. Chuh
  • *此作品的通讯作者
  • CAS - Shanghai Institute of Technical Physics

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

The effect of the thickness on the dielectric and ferroelectric properties of poly(vinylidene fluoride trifluoroethylene) [P(VDF-TrFE)] copolymer thin films were investigated. The results show that the dielectric constant and tunability increase while the coercive field decreases with increasing film thickness. The film thickness also affects both the reversible and irreversible Raleigh parameters in the ac field dependence of dielectric constant. The observed phenomenon can be explained by the existence of interfacial layers between electrodes and film. No obvious thickness-dependent microstructure and ferroelectric transition temperature was observed.

源语言英语
主期刊名Manufacturing Science and Technology
2049-2056
页数8
DOI
出版状态已出版 - 2011
已对外发布
活动2011 International Conference on Advanced Engineering Materials and Technology, AEMT 2011 - Sanya, 中国
期限: 29 7月 201131 7月 2011

出版系列

姓名Advanced Materials Research
295-297
ISSN(印刷版)1022-6680

会议

会议2011 International Conference on Advanced Engineering Materials and Technology, AEMT 2011
国家/地区中国
Sanya
时期29/07/1131/07/11

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