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The Trend of 2D Transistors toward Integrated Circuits: Scaling Down and New Mechanisms

  • Yang Shen
  • , Zuoyuan Dong
  • , Yabin Sun
  • , Hao Guo
  • , Fan Wu
  • , Xianglong Li
  • , Jun Tang
  • , Jun Liu
  • , Xing Wu*
  • , He Tian*
  • , Tian Ling Ren*
  • *此作品的通讯作者
  • Tsinghua University
  • East China Normal University
  • North University of China

科研成果: 期刊稿件文献综述同行评审

摘要

2D transition metal chalcogenide (TMDC) materials, such as MoS2, have recently attracted considerable research interest in the context of their use in ultrascaled devices owing to their excellent electronic properties. Microprocessors and neural network circuits based on MoS2 have been developed at a large scale but still do not have an advantage over silicon in terms of their integrated density. In this study, the current structures, contact engineering, and doping methods for 2D TMDC materials for the scaling-down process and performance optimization are reviewed. Devices are introduced according to a new mechanism to provide the comprehensive prospects for the use of MoS2 beyond the traditional complementary–metal–oxide semiconductor in order to summarize obstacles to the goal of developing high-density and low-power integrated circuits (ICs). Finally, prospects for the use of MoS2 in large-scale ICs from the perspectives of the material, system performance, and application to nonlogic functionalities such as sensor circuits and analogous circuits, are briefly analyzed. The latter issue is along the direction of “more than Moore” research.

源语言英语
文章编号2201916
期刊Advanced Materials
34
48
DOI
出版状态已出版 - 1 12月 2022

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