跳到主要导航 跳到搜索 跳到主要内容

The structural and magnetic properties of τ-MnAl films prepared by Mn/Al multilayers deposition plus annealing

  • C. Y. Duan
  • , X. P. Qiu
  • , B. Ma*
  • , Z. Z. Zhang
  • , Q. Y. Jin
  • *此作品的通讯作者
  • Department of Optical Science and Engineering
  • Fudan University

科研成果: 期刊稿件文章同行评审

摘要

The structural and magnetic properties of τ-MnAl alloy films are studied. The films are derived by annealing from Mn/Al multilayers. τ-MnAl appears when the annealing temperature increases up to 350 °C, but decomposes into γ2-MnAl and β-Mn at 500 °C annealing. Good magnetic properties are obtained after 400-450 °C annealing. Furthermore, τ-MnAl forms in the Mn-Al interface. The saturation magnetization MS increases first with the thickness of Mn (or Al) layers, and then decreases in inverse proportion to that of Mn (or Al) layers. The turning point implies that the thickness of τ-MnAl is no more than 5 nm in the Mn60Al40 films.

源语言英语
页(从-至)185-188
页数4
期刊Materials Science and Engineering: B
162
3
DOI
出版状态已出版 - 15 6月 2009
已对外发布

指纹

探究 'The structural and magnetic properties of τ-MnAl films prepared by Mn/Al multilayers deposition plus annealing' 的科研主题。它们共同构成独一无二的指纹。

引用此