摘要
The effects of the dead layers, which exist between the ferroelectric thin film and the electric electrodes, on the voltage response of the pyroelectric infrared detectors have been studied. By introducing an interface capacitor into the equivalent electric circuit of the device the optical voltage response of the detector were calculated. The results showed that the optical voltage response may decrease with the increase of thin film thickness. There is an optimum value of film thickness where the voltage reaches its maximum. This value spreads over a wide range for different device parameters.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 97-102 |
| 页数 | 6 |
| 期刊 | Integrated Ferroelectrics |
| 卷 | 91 |
| 期 | 1 |
| DOI | |
| 出版状态 | 已出版 - 2007 |
| 已对外发布 | 是 |
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