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The influence of dead layers on the voltage response of ferroelectric film infrared detectors

  • T. Lin*
  • , J. L. Sun
  • , X. J. Meng
  • , J. H. Ma
  • , F. W. Shi
  • , J. Chen
  • , J. H. Chu
  • *此作品的通讯作者
  • CAS - Shanghai Institute of Technical Physics

科研成果: 期刊稿件文章同行评审

摘要

The effects of the dead layers, which exist between the ferroelectric thin film and the electric electrodes, on the voltage response of the pyroelectric infrared detectors have been studied. By introducing an interface capacitor into the equivalent electric circuit of the device the optical voltage response of the detector were calculated. The results showed that the optical voltage response may decrease with the increase of thin film thickness. There is an optimum value of film thickness where the voltage reaches its maximum. This value spreads over a wide range for different device parameters.

源语言英语
页(从-至)97-102
页数6
期刊Integrated Ferroelectrics
91
1
DOI
出版状态已出版 - 2007
已对外发布

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