The grain size effect of the Pb(Zr0.45Ti0.55)O 3 thin films deposited on LaNiO3-coated silicon by modified sol-gel process

S. H. Hu; G. J. Hu; X. J. Meng; G. S. Wang; J. L. Sun; S. L. Guo; J. H. Chu; N. Dai

doi:10.1016/S0022-0248(03)01592-6

The grain size effect of the Pb(Zr_0.45Ti_0.55)O ₃ thin films deposited on LaNiO₃-coated silicon by modified sol-gel process

S. H. Hu^*
, G. J. Hu
, X. J. Meng
, G. S. Wang
, J. L. Sun
, S. L. Guo
, J. H. Chu
, N. Dai

^*此作品的通讯作者

CAS - Shanghai Institute of Technical Physics

科研成果: 期刊稿件 › 文章 › 同行评审

51 引用（Scopus）

摘要

Highly (1 0 0) oriented PZT thin films with different grain sizes have been deposited on an LaNiO₃-coated silicon substrate by a modified sol-gel process. The growth mechanism of films with high (1 0 0) orientation and the effects of grain size on the dielectric and ferroelectric properties of the films are qualitatively discussed. Measurements of dielectric and ferroelectric properties reveal that films of large grain sizes present large relative dielectric permittivity and large remnant polarization.

源语言	英语
页（从-至）	109-114
页数	6
期刊	Journal of Crystal Growth
卷	260
期	1-2
DOI	https://doi.org/10.1016/S0022-0248(03)01592-6
出版状态	已出版 - 2 1月 2004
已对外发布	是

访问文件

10.1016/S0022-0248(03)01592-6

其它文件与链接

链接到 Scopus 的出版物

引用此

@article{db1fc73763ee4971900c11aef7b9ef71,

title = "The grain size effect of the Pb(Zr0.45Ti0.55)O 3 thin films deposited on LaNiO3-coated silicon by modified sol-gel process",

abstract = "Highly (1 0 0) oriented PZT thin films with different grain sizes have been deposited on an LaNiO3-coated silicon substrate by a modified sol-gel process. The growth mechanism of films with high (1 0 0) orientation and the effects of grain size on the dielectric and ferroelectric properties of the films are qualitatively discussed. Measurements of dielectric and ferroelectric properties reveal that films of large grain sizes present large relative dielectric permittivity and large remnant polarization.",

keywords = "A1. X-ray diffraction, B1. Perovskites, B2. Ferroelectric materials",

author = "Hu, \{S. H.\} and Hu, \{G. J.\} and Meng, \{X. J.\} and Wang, \{G. S.\} and Sun, \{J. L.\} and Guo, \{S. L.\} and Chu, \{J. H.\} and N. Dai",

year = "2004",

month = jan,

day = "2",

doi = "10.1016/S0022-0248(03)01592-6",

language = "英语",

volume = "260",

pages = "109--114",

journal = "Journal of Crystal Growth",

issn = "0022-0248",

publisher = "Elsevier B.V.",

number = "1-2",

}

TY - JOUR

T1 - The grain size effect of the Pb(Zr0.45Ti0.55)O 3 thin films deposited on LaNiO3-coated silicon by modified sol-gel process

AU - Hu, S. H.

AU - Hu, G. J.

AU - Meng, X. J.

AU - Wang, G. S.

AU - Sun, J. L.

AU - Guo, S. L.

AU - Chu, J. H.

AU - Dai, N.

PY - 2004/1/2

Y1 - 2004/1/2

N2 - Highly (1 0 0) oriented PZT thin films with different grain sizes have been deposited on an LaNiO3-coated silicon substrate by a modified sol-gel process. The growth mechanism of films with high (1 0 0) orientation and the effects of grain size on the dielectric and ferroelectric properties of the films are qualitatively discussed. Measurements of dielectric and ferroelectric properties reveal that films of large grain sizes present large relative dielectric permittivity and large remnant polarization.

AB - Highly (1 0 0) oriented PZT thin films with different grain sizes have been deposited on an LaNiO3-coated silicon substrate by a modified sol-gel process. The growth mechanism of films with high (1 0 0) orientation and the effects of grain size on the dielectric and ferroelectric properties of the films are qualitatively discussed. Measurements of dielectric and ferroelectric properties reveal that films of large grain sizes present large relative dielectric permittivity and large remnant polarization.

KW - A1. X-ray diffraction

KW - B1. Perovskites

KW - B2. Ferroelectric materials

UR - https://www.scopus.com/pages/publications/0242691938

U2 - 10.1016/S0022-0248(03)01592-6

DO - 10.1016/S0022-0248(03)01592-6

M3 - 文章

AN - SCOPUS:0242691938

SN - 0022-0248

VL - 260

SP - 109

EP - 114

JO - Journal of Crystal Growth

JF - Journal of Crystal Growth

IS - 1-2

ER -

The grain size effect of the Pb(Zr0.45Ti0.55)O 3 thin films deposited on LaNiO3-coated silicon by modified sol-gel process

摘要

访问文件

其它文件与链接

指纹

引用此

The grain size effect of the Pb(Zr_0.45Ti_0.55)O ₃ thin films deposited on LaNiO₃-coated silicon by modified sol-gel process