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The adequacy of different landscape metrics for various landscape patterns

  • Xiuzhen Li*
  • , Hong S. He
  • , Rencang Bu
  • , Qingchun Wen
  • , Yu Chang
  • , Yuanman Hu
  • , Yuehui Li
  • *此作品的通讯作者
  • CAS - Shenyang Institute of Applied Ecology
  • University of Missouri

科研成果: 期刊稿件文章同行评审

摘要

The behavior of several landscape pattern metrics were tested against various pattern scenarios generated by neutral landscape models, including number of classes, scale-map extent, scale-resolution, class proportion, aggregation level - RULE, and aggregation level - SimMap. The results demonstrate that most of the metrics are sensitive to certain pattern scenarios, yet are not sensitive to others; therefore, none of them is appropriate for all aspects of a landscape pattern. Despite these limitations, some of these metrics are recommended for future use, which include total number of patches, average patch size, total edge density, double-logged fractal, contagion, and aggregation index. Special attention should be paid to the relationships between metric values and ecological processes rather than the numbers themselves.

源语言英语
页(从-至)2626-2638
页数13
期刊Pattern Recognition
38
12
DOI
出版状态已出版 - 12月 2005
已对外发布

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