摘要
Titanium dioxide (TiO2) thin films with mixed structure of anatase and rutile were deposited by oxygen plasma assisted pulsed laser deposition, and pure rutile nanocrystalline TiO2 was obtained after post-deposition annealing. The surface morphology was examined by field emission scanning electron microscopy. The crystal structure and the crystallite size were determined using X-ray diffraction. The effects of annealing on the structural evolution and phase transition were examined by Fourier-transform infrared spectroscopy and Raman scattering spectroscopy through the analysis of bonding configurations. A progressive phase transition on annealing temperature occurs above 300°C, and a transformation to pure rutile phase completes at about 900°C. The prepared TiO2 thin films show good transparency in the visible to near infrared region with small variations upon annealing while a red shift in band gap is observed due to annealing.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 180-184 |
| 页数 | 5 |
| 期刊 | Surface and Coatings Technology |
| 卷 | 231 |
| DOI | |
| 出版状态 | 已出版 - 25 9月 2013 |
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