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Subband electron properties of modulation-doped AlxGa1-xN/GaN heterostructures with different barrier thicknesses

  • C. P. Jiang*
  • , S. L. Guo
  • , Z. M. Huang
  • , J. Yu
  • , Y. S. Gui
  • , G. Z. Zheng
  • , J. H. Chu
  • , Z. W. Zheng
  • , B. Shen
  • , Y. D. Zheng
  • *此作品的通讯作者
  • CAS - Shanghai Institute of Technical Physics
  • Nanjing University

科研成果: 期刊稿件文章同行评审

摘要

Magnetotransport properties of modulation-doped heterostructures with different barrier thickness were analyzed in magnetic fields. The elastic strain relaxation of the barrier on subband electron densities and mobilities in the heterostructures was also analyzed using fast fourier transform (FFT). The densities and mobilities of individual subbands were derived by analyzing Shubnikov-de Hass measurements (SdH) oscillations. The results revealed that elastic strain relaxation has strong effects on mobilities of the excited states.

源语言英语
页(从-至)374-376
页数3
期刊Applied Physics Letters
79
3
DOI
出版状态已出版 - 16 7月 2001
已对外发布

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