Study on the refractive index of gaas bulk material by infrared spectroscopic ellipsometry

Zhi Ming Huang; Hua Mei Ji; Min Hui Chen; Guo Liang Shi; Shi Wei Chen; Liang Yao Chen; Jun Hao Chu

Study on the refractive index of gaas bulk material by infrared spectroscopic ellipsometry

Zhi Ming Huang^*
, Hua Mei Ji
, Min Hui Chen
, Guo Liang Shi
, Shi Wei Chen
, Liang Yao Chen
, Jun Hao Chu

^*此作品的通讯作者

科研成果: 期刊稿件 › 文章 › 同行评审

摘要

The refractive index of GaAs bulk material was studied using infrared spectroscopic ellipsometer (2.5∼12.5μm). Comparisons with data obtained by other methods were also presented, showing good agreement between them.

源语言	英语
页（从-至）	25
页数	1
期刊	Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves
卷	18
期	1
出版状态	已出版 - 1999
已对外发布	是

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@article{1d5be9cb9e434abfa27603b418c0dc12,

title = "Study on the refractive index of gaas bulk material by infrared spectroscopic ellipsometry",

abstract = "The refractive index of GaAs bulk material was studied using infrared spectroscopic ellipsometer (2.5∼12.5μm). Comparisons with data obtained by other methods were also presented, showing good agreement between them.",

keywords = "Gaas bulk material, Infrared ellipsometric spectroscopy, Refractive index",

author = "Huang, \{Zhi Ming\} and Ji, \{Hua Mei\} and Chen, \{Min Hui\} and Shi, \{Guo Liang\} and Chen, \{Shi Wei\} and Chen, \{Liang Yao\} and Chu, \{Jun Hao\}",

year = "1999",

language = "英语",

volume = "18",

pages = "25",

journal = "Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves",

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T1 - Study on the refractive index of gaas bulk material by infrared spectroscopic ellipsometry

AU - Huang, Zhi Ming

AU - Ji, Hua Mei

AU - Chen, Min Hui

AU - Shi, Guo Liang

AU - Chen, Shi Wei

AU - Chen, Liang Yao

AU - Chu, Jun Hao

PY - 1999

Y1 - 1999

N2 - The refractive index of GaAs bulk material was studied using infrared spectroscopic ellipsometer (2.5∼12.5μm). Comparisons with data obtained by other methods were also presented, showing good agreement between them.

AB - The refractive index of GaAs bulk material was studied using infrared spectroscopic ellipsometer (2.5∼12.5μm). Comparisons with data obtained by other methods were also presented, showing good agreement between them.

KW - Gaas bulk material

KW - Infrared ellipsometric spectroscopy

KW - Refractive index

UR - https://www.scopus.com/pages/publications/33746725272

M3 - 文章

AN - SCOPUS:33746725272

SN - 1001-9014

VL - 18

SP - 25

JO - Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves

JF - Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves

IS - 1

ER -

Study on the refractive index of gaas bulk material by infrared spectroscopic ellipsometry

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