摘要
By using quantitative mobility spectrum analysis technique, the temperature-dependent density and mobility for each subband of the accumulated layer on the n-HgCdTe devices have been determined from magnetic-field-dependent Hall and resistivity data. The results agree well with the Shubnikov-de Hass measurements and theoretical calculations.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 1359-1360 |
| 页数 | 2 |
| 期刊 | Wuli Xuebao/Acta Physica Sinica |
| 卷 | 47 |
| 期 | 8 |
| 出版状态 | 已出版 - 1998 |
| 已对外发布 | 是 |
指纹
探究 'Study on the electron mobility for each subband on the n-HgCdTe accumulated layer' 的科研主题。它们共同构成独一无二的指纹。引用此
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