Study on the composition profile of a Hg_1-xCd_xTe epitaxy film by infrared transmission spectroscopy

Based on our empirical rules for the intrinsic absorption coefficient and refractive index of Hg_1-xCd_xTe in Hougen's model, a useful method for determining the composition profile of an epitaxy layer from room-temperature infrared transmittance spectroscopy is presented. The compositional depth non-uniformity of Hg_1-xCd_xTe film samples grown by liquid-phase epitaxy, metal-organic chemical vapour deposition and molecular beam epitaxy techniques is determined using this method and compared with that from secondary ion mass spectroscopy and X-ray microprobic measurements.