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Study on the As redistribution in β-FeSi2 film prepared by reactive deposition epitaxy

  • Lianwei Wang*
  • , Chenglu Lin
  • , Xiangdong Chen
  • , Shichang Zou
  • , Zuyao Zhou
  • , Xianghuai Liu
  • *此作品的通讯作者
  • Chinese Academy of Sciences

科研成果: 会议稿件论文同行评审

摘要

In this paper, we report on the As redistribution properties in β-FeSi2 prepared by reactive deposition epitaxy. Unlike the case of solid phase epitaxy, no snow plough effect has been found. Arsenic atoms become resident in the surface silicide layer, indicating that the diffusion process during the reactive deposition is different from the case of solid phase epitaxy. Further annealing drive the arsenic atoms out of the film.

源语言英语
721-724
页数4
出版状态已出版 - 1996
已对外发布
活动Proceedings of the 1996 11th International Conference on Ion Implantation Technology - Austin, TX, USA
期限: 16 6月 199621 6月 1996

会议

会议Proceedings of the 1996 11th International Conference on Ion Implantation Technology
Austin, TX, USA
时期16/06/9621/06/96

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