摘要
In this paper, we report on the As redistribution properties in β-FeSi2 prepared by reactive deposition epitaxy. Unlike the case of solid phase epitaxy, no snow plough effect has been found. Arsenic atoms become resident in the surface silicide layer, indicating that the diffusion process during the reactive deposition is different from the case of solid phase epitaxy. Further annealing drive the arsenic atoms out of the film.
| 源语言 | 英语 |
|---|---|
| 页 | 721-724 |
| 页数 | 4 |
| 出版状态 | 已出版 - 1996 |
| 已对外发布 | 是 |
| 活动 | Proceedings of the 1996 11th International Conference on Ion Implantation Technology - Austin, TX, USA 期限: 16 6月 1996 → 21 6月 1996 |
会议
| 会议 | Proceedings of the 1996 11th International Conference on Ion Implantation Technology |
|---|---|
| 市 | Austin, TX, USA |
| 时期 | 16/06/96 → 21/06/96 |
学术指纹
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