摘要
Zn inclusions/precipitates in Bridgman-grown CdZnTe crystals, for the first time, have been characterized by scanning electron microscopy with an electron probe X-ray microanalyzer (SEM/EPMA). The Zn inclusions/precipitates in CdZnTe crystals are possibly due to Zn segregation effects resulting from the deviation from the congruent melting point. It is also shown that Te-and Cd-rich regions surrounding the Zn inclusions/precipitates edge, due to the non-stoichiometric solid compositions, lead to the formation of Te and/or Cd precipitates around the Zn inclusions/precipitates. The infrared transmittance of these stoichiometric-type CdZnTe is about 64% in the wavenumber range of 400-4000 cm-1.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 357-360 |
| 页数 | 4 |
| 期刊 | Journal of Crystal Growth |
| 卷 | 171 |
| 期 | 3-4 |
| DOI | |
| 出版状态 | 已出版 - 2月 1997 |
| 已对外发布 | 是 |
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