@inproceedings{f4cbaf6444c149328a8af2e70697dc98,
title = "Structural and optical properties of LuFeO 3 thin films prepared on silicon (100) substrate by pulsed laser deposition",
abstract = "The LuFeO 3 (LFO) nanocrystalline films with the average grain size of 20 nm have been grown on silicon (100) substrates by pulsed laser deposition. X-ray diffraction (XRD) analysis shows that LFO films are polycrystalline. The microstructure and surface morphology of LFO film are analyzed by Atomic force microscope (AFM) and the surface shows the film is compact. Spectroscopic ellipsometry (SE) was used to extract the optical properties of LFO films in the 1.1-3.1 eV (400-1100 nm) photon energy range at room temperature. By fitting the measured ellipsometric parameter data with a multilayer model system for the LFO thin films, the optical constants and thicknesses of the thin films have been obtained. The refractive index n and extinction coefficient k of the LFO thin films both decreases with increasing thickness.",
keywords = "Ferroelectric films, LuFeO, Optical properties, Pulsed laser deposition",
author = "Liping Zhu and Hongmei Deng and Jianjun Tian and Pingxiong Yang and Junhao Chu",
year = "2012",
doi = "10.1117/12.914548",
language = "英语",
isbn = "9780819489906",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
booktitle = "Photonics and Optolectronics Meetings (POEM) 2011",
note = "Photonics and Optolectronics Meetings (POEM) 2011: Optoelectronic Devices and Integration ; Conference date: 02-11-2011 Through 05-11-2011",
}