跳到主要导航 跳到搜索 跳到主要内容

Structural and electrical properties of Mn1.56Co 0.96Ni0.48O4 NTC thermistor films

  • Y. Q. Gao*
  • , Z. M. Huang
  • , Y. Hou
  • , J. Wu
  • , W. Zhou
  • , C. Ouyang
  • , J. G. Huang
  • , J. C. Tong
  • , J. H. Chu
  • *此作品的通讯作者
  • CAS - Shanghai Institute of Technical Physics

科研成果: 期刊稿件文章同行评审

摘要

High quality Mn1.56Co0.96Ni0.48O 4 (MCN) films have been prepared by chemical solution deposition method. The microstructure and electrical properties of the films are investigated with different layers. Both the crystalline quality and the grain size improve when the film layers increase. The theoretical lattice constant acal is slightly smaller compared with the XRD experiment results afilm. The temperature dependence of resistivity can be described by a variable range hopping model for a parabolic density of states. With the increase of film layers, the sensitivity and stability of the MCN films increase. The advantage of good negative temperature coefficient thermistor characteristic makes the MCN films very preponderant for thermal sensors.

源语言英语
页(从-至)74-78
页数5
期刊Materials Science and Engineering: B
185
1
DOI
出版状态已出版 - 7月 2014
已对外发布

指纹

探究 'Structural and electrical properties of Mn1.56Co 0.96Ni0.48O4 NTC thermistor films' 的科研主题。它们共同构成独一无二的指纹。

引用此