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Stability of transparent conducting oxide films deposited by sputtering for solar cells applications

  • Z. A. Wang
  • , H. B. Zhu
  • , D. W. Zhang
  • , J. H. Shi
  • , X. D. Li
  • , W. J. Cheng
  • , Z. Sun
  • , S. M. Huang

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

The stability of transparent conducting oxide (TCO) films with bi-layered structures has been tested in air at temperatures up to 550 °C. Aluminum-doped ZnO and Sn-doped In2O3 (AZO/ITO) transparent conducting oxide (TCO) films were deposited on glass substrates by a home made radio-frequency (RF) magnetron sputtering system at room temperature in pure argon ambient. A typical commercial ITO and AZO films by mid-frequency (MF) magnetron sputtering at a substrate temperature of 350 °C were also investigated for comparison. A strong decrease of electrical conductivity was observed after testing at temperature above 350°C for RF deposited bi-layered TCO as well as for the commercial ITO, while the AZO films deposited by MF magnetron sputtering showed a quite stable electrical property at temperature not greater than 500°C. The optical absorption edge was found to shift to the longer wavelength with an increase in testing temperature for all the TCO. MF sputtered AZO films were used as transparent front contacts for the fabrication of copper indium gallium selenide (CIGS) superstrate thin film solar cells.

源语言英语
主期刊名2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009
676-679
页数4
DOI
出版状态已出版 - 2009
已对外发布
活动2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009 - Philadelphia, PA, 美国
期限: 7 6月 200912 6月 2009

出版系列

姓名Conference Record of the IEEE Photovoltaic Specialists Conference
ISSN(印刷版)0160-8371

会议

会议2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009
国家/地区美国
Philadelphia, PA
时期7/06/0912/06/09

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