Spectroscopic ellipsometry of SrBi 2Ta 2-xNb xO 9 ferroelectric thin films

Pingxiong Yang; Ming Guo; Meirong Shi; Xiangjian Meng; Zhimin Huang; Junhao Chu

doi:10.1063/1.1901832

Spectroscopic ellipsometry of SrBi ₂Ta _2-xNb _xO ₉ ferroelectric thin films

Pingxiong Yang^*
, Ming Guo
, Meirong Shi
, Xiangjian Meng
, Zhimin Huang
, Junhao Chu

^*此作品的通讯作者

物理与电子科学学院

East China Normal University
CAS - Shanghai Institute of Technical Physics

科研成果: 期刊稿件 › 文章 › 同行评审

16 引用（Scopus）

摘要

Optical properties of the ferroelectric thin-film SrBi2Ta2-xNbxO9 (0≤x≤2) solid-solution system were investigated by spectroscopic ellipsometry from the infrared to the ultraviolet-visible region. Optical constants and the band-gap energies were determined by multilayer analysis of the respective pseudodielectric functions. With increasing x, it is found that the refractive index slightly increases in the infrared and rises from 2.0 to 2.3 in the visible region, and the band-gap energy shifts from 4.17 to 3.61 eV at room temperature. A possible explanation for the experimental observations, the reduced extension of the Nb 4d orbital, is mentioned.

源语言	英语
文章编号	106106
期刊	Journal of Applied Physics
卷	97
期	10
DOI	https://doi.org/10.1063/1.1901832
出版状态	已出版 - 15 5月 2005

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title = "Spectroscopic ellipsometry of SrBi 2Ta 2-xNb xO 9 ferroelectric thin films",

abstract = "Optical properties of the ferroelectric thin-film SrBi2Ta2-xNbxO9 (0≤x≤2) solid-solution system were investigated by spectroscopic ellipsometry from the infrared to the ultraviolet-visible region. Optical constants and the band-gap energies were determined by multilayer analysis of the respective pseudodielectric functions. With increasing x, it is found that the refractive index slightly increases in the infrared and rises from 2.0 to 2.3 in the visible region, and the band-gap energy shifts from 4.17 to 3.61 eV at room temperature. A possible explanation for the experimental observations, the reduced extension of the Nb 4d orbital, is mentioned.",

author = "Pingxiong Yang and Ming Guo and Meirong Shi and Xiangjian Meng and Zhimin Huang and Junhao Chu",

year = "2005",

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T1 - Spectroscopic ellipsometry of SrBi 2Ta 2-xNb xO 9 ferroelectric thin films

AU - Yang, Pingxiong

AU - Guo, Ming

AU - Shi, Meirong

AU - Meng, Xiangjian

AU - Huang, Zhimin

AU - Chu, Junhao

PY - 2005/5/15

Y1 - 2005/5/15

N2 - Optical properties of the ferroelectric thin-film SrBi2Ta2-xNbxO9 (0≤x≤2) solid-solution system were investigated by spectroscopic ellipsometry from the infrared to the ultraviolet-visible region. Optical constants and the band-gap energies were determined by multilayer analysis of the respective pseudodielectric functions. With increasing x, it is found that the refractive index slightly increases in the infrared and rises from 2.0 to 2.3 in the visible region, and the band-gap energy shifts from 4.17 to 3.61 eV at room temperature. A possible explanation for the experimental observations, the reduced extension of the Nb 4d orbital, is mentioned.

AB - Optical properties of the ferroelectric thin-film SrBi2Ta2-xNbxO9 (0≤x≤2) solid-solution system were investigated by spectroscopic ellipsometry from the infrared to the ultraviolet-visible region. Optical constants and the band-gap energies were determined by multilayer analysis of the respective pseudodielectric functions. With increasing x, it is found that the refractive index slightly increases in the infrared and rises from 2.0 to 2.3 in the visible region, and the band-gap energy shifts from 4.17 to 3.61 eV at room temperature. A possible explanation for the experimental observations, the reduced extension of the Nb 4d orbital, is mentioned.

UR - https://www.scopus.com/pages/publications/20944435507

U2 - 10.1063/1.1901832

DO - 10.1063/1.1901832

M3 - 文章

AN - SCOPUS:20944435507

SN - 0021-8979

VL - 97

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 10

M1 - 106106

ER -

Spectroscopic ellipsometry of SrBi 2Ta 2-xNb xO 9 ferroelectric thin films

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Spectroscopic ellipsometry of SrBi ₂Ta _2-xNb _xO ₉ ferroelectric thin films