摘要
The investigation on Fe doped Hg1-xCdxTe samples has been performed by infrared transmission spectroscopy, photoluminescence spectroscopy and Hall measurements. The Fe impurity behavior doped in Hg1-xCdxTe has been studied, a donor level which is about 80meV below the bottom of the conduction band was discovered. Exhibiting no electrical activity, the Fe doped in Hg1-xCdxTe can influence the non-equilibrium carrier lifetime by acting as the non-radiative combination center, which can be discovered through the temperature dependence of integrated photoluminescence intensity.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 258-263 |
| 页数 | 6 |
| 期刊 | Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors |
| 卷 | 18 |
| 期 | 4 |
| 出版状态 | 已出版 - 4月 1997 |
| 已对外发布 | 是 |
指纹
探究 'Spectroscopic and electrical investigation of Fe doped Hg1-xCdxTe' 的科研主题。它们共同构成独一无二的指纹。引用此
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver