摘要
Single-crystalline and single-domain PbTiO3 films with thickness of 3000 Å have been prepared by metalorganic chemical vapor deposition (MOCVD), using metalorganic precursors of tetra-ethyl-lead and iso-propoxide titanium. The nature of single-crystalline epitaxy and single domain of as-grown films was characterized by x-ray diffraction (XRD), synchrotron radiation (SR), and Rutherford backscattering (RBS). Using atomic force microscopy (AFM), the evidence of layer-by-layer growth was observed. The growth steps on the surface may be attributable to the formation of single-crystalline and single-domain PbTiO3 film with 3000-Å thickness.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 3503 |
| 页数 | 1 |
| 期刊 | Applied Physics Letters |
| 卷 | 67 |
| DOI | |
| 出版状态 | 已出版 - 1995 |
| 已对外发布 | 是 |
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