跳到主要导航 跳到搜索 跳到主要内容

Single crystalline InAsxSb1-x grown on (100) InSb substrate by liquid phase epitaxy

  • Changhong Sun
  • , Shuhong Hu
  • , Qiwei Wang
  • , Feng Qiu
  • , Yingfei Lv
  • , Huiyong Deng
  • , Yan Sun
  • , Ning Dai*
  • *此作品的通讯作者
  • CAS - Shanghai Institute of Technical Physics

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Single crystalline InAs0.016Sb0.984 film has been successfully grown on (100) InSb substrate by LPE method. A large supercooling (ΔT = 15 °C) had been used to prevent substrate from dissolving into the epilayer. High resolution X-ray diffraction (HRXRD) measurement was used to characterize the crystal quality of the film. Only (200) and (400) peaks were observed from the XRD spectrum, indicating that the film was single crystalline with (100) orientation. The Fourier transform infrared (FTIR) transmission spectrum of the film at room temperature revealed 7.77 μm cut-off wavelength of the film. The lattice dynamics of the epilayer was studied by Raman scattering, suggests two-mode behavior of the optical phonons.

源语言英语
主期刊名6th International Symposium on Advanced Optical Manufacturing and Testing Technologies
主期刊副标题Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy
DOI
出版状态已出版 - 2012
已对外发布
活动6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy - Xiamen, 中国
期限: 26 4月 201229 4月 2012

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
8419
ISSN(印刷版)0277-786X

会议

会议6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy
国家/地区中国
Xiamen
时期26/04/1229/04/12

指纹

探究 'Single crystalline InAsxSb1-x grown on (100) InSb substrate by liquid phase epitaxy' 的科研主题。它们共同构成独一无二的指纹。

引用此