摘要
Achieving high mobility while minimizing off-current and static power consumption is critical for applications of two-dimensional field-effect transistors. Herein, a selenium (Se) sacrificial layer is introduced between the rhenium sulfide (ReS2) semiconductor and source/drain electrode. With the Se layer and postannealing process, the ReS2 transistor significantly decreases the off-state current with a substantial increase in the on-state current density. Notably, the mobility reaches 237 cm2 V-1 s-1, which is accompanied by an extraordinary current on/off ratio of 1011 at 7 K. The theoretical calculations and noise analysis show that the improvement in device performance is ascribed to the Se protective layer, which effectively shields the semiconductor from direct exposure to high-energy metal particles, reducing the Schottky barrier and the number of defect states at the interface. Finally, Se sacrificial ReS2 transistor-based versatile logic circuits including NAND and NOR logic are executed, which can be widely applied in integrated circuits.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 655-662 |
| 页数 | 8 |
| 期刊 | Nano Letters |
| 卷 | 25 |
| 期 | 2 |
| DOI | |
| 出版状态 | 已出版 - 15 1月 2025 |
指纹
探究 'Selenium Interface Layers Boost High Mobility and Switch Ratios in van der Waals Electronics' 的科研主题。它们共同构成独一无二的指纹。引用此
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