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Selenium Interface Layers Boost High Mobility and Switch Ratios in van der Waals Electronics

  • Chi Zhang
  • , Enlong Li
  • , Caifang Gao
  • , Ruixue Wang
  • , Xinling Liu
  • , Yu Liu
  • , Feng Yuan
  • , Wu Shi
  • , Yen Fu Lin
  • , Junhao Chu
  • , Wenwu Li*
  • *此作品的通讯作者
  • Fudan University
  • East China Normal University
  • National Chung Hsing University

科研成果: 期刊稿件文章同行评审

摘要

Achieving high mobility while minimizing off-current and static power consumption is critical for applications of two-dimensional field-effect transistors. Herein, a selenium (Se) sacrificial layer is introduced between the rhenium sulfide (ReS2) semiconductor and source/drain electrode. With the Se layer and postannealing process, the ReS2 transistor significantly decreases the off-state current with a substantial increase in the on-state current density. Notably, the mobility reaches 237 cm2 V-1 s-1, which is accompanied by an extraordinary current on/off ratio of 1011 at 7 K. The theoretical calculations and noise analysis show that the improvement in device performance is ascribed to the Se protective layer, which effectively shields the semiconductor from direct exposure to high-energy metal particles, reducing the Schottky barrier and the number of defect states at the interface. Finally, Se sacrificial ReS2 transistor-based versatile logic circuits including NAND and NOR logic are executed, which can be widely applied in integrated circuits.

源语言英语
页(从-至)655-662
页数8
期刊Nano Letters
25
2
DOI
出版状态已出版 - 15 1月 2025

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