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Scan-to-bim methodology adapted for different application

  • V. Badenko*
  • , A. Fedotov
  • , D. Zotov
  • , S. Lytkin
  • , D. Volgin
  • , R. D. Garg
  • , Liu Min
  • *此作品的通讯作者
  • Peter the Great St. Petersburg Polytechnic University
  • Indian Institute of Technology Roorkee

科研成果: 期刊稿件 › 会议文章 › 同行评审

摘要

In this paper we proposed a methodology that describes the major steps of a scan-to-BIM process. The methodology includes six steps: (1) classification of considered elements, (2) definition of required level of detail (GI), (3) scan data acquisition, (4) point cloud registration and segmentation, (5) as-built BIM creation and (6) analysis. The examples of the application of the proposed methodology are demonstrated by creation of as-built BIM models for existing industrial sites and historic buildings. As the results of these case studies have shown, the proposed methodology can be used for as-built BIMs without any prior information.

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