Refractive index and absorption of an indium phthalocyanine thin film

Xiaodong Tang; Qiyang Chen; Donghong Gu; Fuxi Gan

Refractive index and absorption of an indium phthalocyanine thin film

Xiaodong Tang^*
, Qiyang Chen
, Donghong Gu
, Fuxi Gan

^*此作品的通讯作者

CAS - Shanghai Institute of Optics and Fine Mechanics

科研成果: 期刊稿件 › 文章 › 同行评审

摘要

A thin film of indium phthalocyanine (InPc) was obtained by vacuum deposition on single-crystal silicon. The ellipsometric spectra of the InPc thin film have been investigated on a scanning ellipsometer with the analyzer and polarizer rotating synchronously. It is revealed that there is a comparatively large absorption in the wavelength range of 600-800 nm. The spectrum is explained with its energy levels structure.

源语言	英语
页（从-至）	925-929
页数	5
期刊	Zhongguo Jiguang/Chinese Journal of Lasers
卷	22
期	12
出版状态	已出版 - 12月 1995
已对外发布	是

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title = "Refractive index and absorption of an indium phthalocyanine thin film",

abstract = "A thin film of indium phthalocyanine (InPc) was obtained by vacuum deposition on single-crystal silicon. The ellipsometric spectra of the InPc thin film have been investigated on a scanning ellipsometer with the analyzer and polarizer rotating synchronously. It is revealed that there is a comparatively large absorption in the wavelength range of 600-800 nm. The spectrum is explained with its energy levels structure.",

author = "Xiaodong Tang and Qiyang Chen and Donghong Gu and Fuxi Gan",

year = "1995",

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TY - JOUR

T1 - Refractive index and absorption of an indium phthalocyanine thin film

AU - Tang, Xiaodong

AU - Chen, Qiyang

AU - Gu, Donghong

AU - Gan, Fuxi

PY - 1995/12

Y1 - 1995/12

N2 - A thin film of indium phthalocyanine (InPc) was obtained by vacuum deposition on single-crystal silicon. The ellipsometric spectra of the InPc thin film have been investigated on a scanning ellipsometer with the analyzer and polarizer rotating synchronously. It is revealed that there is a comparatively large absorption in the wavelength range of 600-800 nm. The spectrum is explained with its energy levels structure.

AB - A thin film of indium phthalocyanine (InPc) was obtained by vacuum deposition on single-crystal silicon. The ellipsometric spectra of the InPc thin film have been investigated on a scanning ellipsometer with the analyzer and polarizer rotating synchronously. It is revealed that there is a comparatively large absorption in the wavelength range of 600-800 nm. The spectrum is explained with its energy levels structure.

UR - https://www.scopus.com/pages/publications/0029519468

M3 - 文章

AN - SCOPUS:0029519468

SN - 0258-7025

VL - 22

SP - 925

EP - 929

JO - Zhongguo Jiguang/Chinese Journal of Lasers

JF - Zhongguo Jiguang/Chinese Journal of Lasers

IS - 12

ER -

Refractive index and absorption of an indium phthalocyanine thin film

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