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Recent progress on HgCdTe at the national laboratory for infrared physics in China

  • Junhao Chu*
  • , Dingyuan Tang
  • *此作品的通讯作者
  • CAS - Shanghai Institute of Technical Physics

科研成果: 期刊稿件文章同行评审

摘要

The characterization of impurities, defects, uniformity and some fundamental properties for the bulk and epitaxial HgCdTe (MCT) material, undoped and doped with Sb, As, Fe, have been investigated recently in the authors' laboratory by means of photoluminescence, magneto-photoconductivity, quantum capacitance spectroscopy, transport measurements, and other contactless and nondestructive methods such as the infrared, far-infrared, and millimeter wave measurements. This paper reports a portion of these new results.

源语言英语
页(从-至)1176-1182
页数7
期刊Journal of Electronic Materials
25
8
DOI
出版状态已出版 - 8月 1996
已对外发布

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