摘要
The characterization of impurities, defects, uniformity and some fundamental properties for the bulk and epitaxial HgCdTe (MCT) material, undoped and doped with Sb, As, Fe, have been investigated recently in the authors' laboratory by means of photoluminescence, magneto-photoconductivity, quantum capacitance spectroscopy, transport measurements, and other contactless and nondestructive methods such as the infrared, far-infrared, and millimeter wave measurements. This paper reports a portion of these new results.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 1176-1182 |
| 页数 | 7 |
| 期刊 | Journal of Electronic Materials |
| 卷 | 25 |
| 期 | 8 |
| DOI | |
| 出版状态 | 已出版 - 8月 1996 |
| 已对外发布 | 是 |
学术指纹
探究 'Recent progress on HgCdTe at the national laboratory for infrared physics in China' 的科研主题。它们共同构成独一无二的学术指纹。引用此
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