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Recent progress of hafnium oxide-based ferroelectric devices for advanced circuit applications

  • Zhaohao Zhang
  • , Guoliang Tian
  • , Jiali Huo
  • , Fang Zhang
  • , Qingzhu Zhang
  • , Gaobo Xu
  • , Zhenhua Wu
  • , Yan Cheng
  • , Yan Liu
  • , Huaxiang Yin*
  • *此作品的通讯作者
  • CAS - Institute of Microelectronics
  • University of Chinese Academy of Sciences
  • Xidian University

科研成果: 期刊稿件文献综述同行评审

摘要

Hafnium oxide-based ferroelectric field-effect-transistors (FeFET), which combine super-steep logical switching and low power non-volatile memory functions, have significant potential for post-Moore integrated circuit innovations with higher energy efficiency and larger integration scale. In this review, recent research into hafnium oxide-based ferroelectric (FE) films and different functional devices is presented, from fundamentals to applications. Different technological challenges and state-of-the-art research and development efforts related to the physical understanding and performance optimization of FE films, advanced hafnium oxide-based device integration, and device applications in logic-in-memory and artificial synapses and neurons for neuromorphic computing are addressed.

源语言英语
文章编号200405
期刊Science China Information Sciences
66
10
DOI
出版状态已出版 - 10月 2023

联合国可持续发展目标

此成果有助于实现下列可持续发展目标:

  1. 可持续发展目标 7 - 经济适用的清洁能源
    可持续发展目标 7 经济适用的清洁能源

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