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Raman spectroscopy characterization of two-dimensional materials

  • Fang Liang
  • , Hejun Xu
  • , Xing Wu*
  • , Chaolun Wang
  • , Chen Luo
  • , Jian Zhang
  • *此作品的通讯作者
  • East China Normal University

科研成果: 期刊稿件文献综述同行评审

摘要

Two-dimensional (2D) materials have become a hot study topic in recent years due to their outstanding electronic, optical, and thermal properties. The unique band structures of strong in-plane chemical bonds and weak out-of-plane van der Waals (vdW) interactions make 2D materials promising for nanodevices and various other applications. Raman spectroscopy is a powerful and non-destructive characterization tool to study the properties of 2D materials. In this work, we review the research on the characterization of 2D materials with Raman spectroscopy. In addition, we discuss the application of the Raman spectroscopy technique to semiconductors, superconductivity, photoelectricity, and thermoelectricity.

源语言英语
文章编号037802
期刊Chinese Physics B
27
3
DOI
出版状态已出版 - 3月 2018

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