摘要
We report the observation of photocurrent spectrum involving both the fundamental interband, extrinsic defect transitions 3-FeSi2 and the intrinsic transitions of Si substrate and demonstrate the sensitivity and reliability of the photocurrent measurement for revealing the energy band structure of B-FeSi2. The transition energies are in good agreement with the results of absorption measurement and the theoretical calculation based on a simple recombination model.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 34-37 |
| 页数 | 4 |
| 期刊 | Chinese Physics Letters |
| 卷 | 12 |
| 期 | 1 |
| DOI | |
| 出版状态 | 已出版 - 1月 1995 |
| 已对外发布 | 是 |
指纹
探究 'Photocurrent studies of (β-FeSi2 thin films' 的科研主题。它们共同构成独一无二的指纹。引用此
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