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Phase-change material Ge0.61Sb2Te for application in high-speed phase change random access memory

  • Yifeng Gu*
  • , Sannian Song
  • , Zhitang Song
  • , Suyuan Bai
  • , Yan Cheng
  • , Zhonghua Zhang
  • , Bo Liu
  • , Songlin Feng
  • *此作品的通讯作者
  • CAS - Shanghai Institute of Microsystem and Information Technology
  • University of Chinese Academy of Sciences
  • CAS - Shanghai Institute of Technical Physics
  • Liaoning Normal University

科研成果: 期刊稿件文章同行评审

摘要

Compared with Ge2Sb2Te5, Ge 0.61Sb2Te has higher crystallization temperature (∼200.5 °C), larger crystallization activation energy (∼3.28 eV), and better data retention (∼120.8 °C for 10 yr). The switching between amorphous and crystalline state could be triggered by the electric pulse of as short as 10 ns. With the resistance ratio of two orders of magnitude, the endurance test was up to 106 cycles. Ge0.61Sb 2Te material is a promising candidate for the trade-off between programming speed and data retention.

源语言英语
文章编号103110
期刊Applied Physics Letters
102
10
DOI
出版状态已出版 - 11 3月 2013
已对外发布

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