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Optimization of the cell structure for radiation-hardened power MOSFETs

  • Teng Wang
  • , Xin Wan*
  • , Hu Jin
  • , Hao Li
  • , Yabin Sun
  • , Renrong Liang
  • , Jun Xu
  • , Lirong Zheng
  • *此作品的通讯作者
  • Fudan University
  • Aurorachip Co. Ltd.
  • Tsinghua University

科研成果: 期刊稿件 › 文章 › 同行评审

摘要

Power MOSFETs specially designed for space power systems are expected to simultaneously meet the requirements of electrical performance and radiation hardness. Radiationhardened (rad-hard) power MOSFET design can be achieved via cell structure optimization. This paper conducts an investigation of the cell geometrical parameters with major impacts on radiation hardness, and a rad-hard power MOSFET is designed and fabricated. The experimental results validate the devices’ total ionizing dose (TID) and single event effects (SEE) hardness to suitably satisfy most space power system requirements while maintaining acceptable electrical performance.

源语言英语
期刊论文编号598
期刊Electronics (Switzerland)
卷8
期6
DOI
出版状态已出版 - 6月 2019

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