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Optical properties of Bi3.25La0.75Ti3O12 thin films using spectroscopic ellipsometry

  • CAS - Shanghai Institute of Technical Physics

科研成果: 期刊稿件 › 文章 › 同行评审

摘要

The optical properties of Bi3.25La0.75Ti3O12 thin films were studied by using spectroscopic ellipsometry. The thin films with different film thicknesses on platinized silicon substrates were prepared by chemical solution methods. It was found that the extinction coefficient decreased with increasing thickness where as the refractive index increased with the increasing thickness.

源语言英语
页(从-至)3811-3815
页数5
期刊Journal of Applied Physics
卷93
期7
DOI
出版状态已出版 - 1 4月 2003
已对外发布是

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