摘要
The BiCrxFe1-xO3 thin films were fabricated on Si substrate by sol-gel method with x range from 0 to 0.05. X-ray diffraction analysis shows that both pure BiFeO3 thin film and Cr-doped BiFeO3 thin films have rhombohedral structure with space group R3c. Moreover, the influence of different values of x on the extinction coefficient and refractive index were investigated in order to exploit their possible application in optoelectronic devices. The optical constants of the Cr-doped BiFeO3 thin films in the wavelength range 500-1100 nm were obtained by spectroscopic ellipsometry, and the band-gap energy of BiCr 0.03Fe0.97O3 was found to be 2.40 ±0.02 eV, and that of BiCr0.05Fe0.95O3 was 2.30 ±0.02 eV.
| 源语言 | 英语 |
|---|---|
| 文章编号 | 012162 |
| 期刊 | Journal of Physics: Conference Series |
| 卷 | 276 |
| 期 | 1 |
| DOI | |
| 出版状态 | 已出版 - 2011 |
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