@inproceedings{8c51744627dd4b9286d8d7297f5418c9,
title = "Novel method to determine base resistance in SiGe HBT HICUM based on rational function fitting",
abstract = "An accurate and efficient base resistance (RB) extraction methodology for SiGe HBT HICUM model is developed in this paper. Differing from previous methods, the proposed technique is based on the rational function fitting. Two formulas are used to determine the lower and upper limits of RB, and then RB is confined to a very narrow range and can be estimated analytically only from S-parameter data, without any special structures or numerical optimization. The proposed method is successfully applied to SiGe HBTs with different device geometries. Results demonstrate that the average error for extracted RB is less than 2.5\% over a wide range of bias points. Therefore, we believe that the proposed technique is a reliable routine applicable to estimation of the base resistance for SiGe HBT HICUM model.",
author = "Yabin Sun and Jun Fu and Ji Yang and Jun Xu and Yudong Wang and Wei Zhou and Wei Zhang and Jie Cui and Zhihong Liu",
note = "Publisher Copyright: {\textcopyright} 2014 IEEE.; 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2014 ; Conference date: 28-10-2014 Through 31-10-2014",
year = "2014",
month = jan,
day = "23",
doi = "10.1109/ICSICT.2014.7021629",
language = "英语",
series = "Proceedings - 2014 IEEE 12th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2014",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
editor = "Jia Zhou and Ting-Ao Tang",
booktitle = "Proceedings - 2014 IEEE 12th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2014",
address = "美国",
}