@inproceedings{274fc9fe9d974e7eab2740834ab2f1a4,
title = "Novel extraction of emitter resistance of SiGe HBTs from forward-Gummel measurements",
abstract = "A simple dc method for determining the emitter series resistances of bipolar transistors from the measured forward-Gummel characteristics is proposed. The method is successfully applied to a set of SiGe HBTs with different sizes, which have been fabricated and measured over a large temperature range. As a result, the temperature scaling and geometric scaling characteristics of the extracted emitter series resistances are analyzed and discussed.",
keywords = "Emitter resistance, Forward-Gummel measurements, Scalble model, SiGe HBT",
author = "Ji Yang and Jun Fu and Yabin Sun and Yudong Wang and Wei Zhou and Wei Zhang and Jie Cui and Gaoqing Li and Zhihong Liu",
note = "Publisher Copyright: {\textcopyright} 2014 IEEE.; 2014 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2014 ; Conference date: 18-06-2014 Through 20-06-2014",
year = "2014",
month = mar,
day = "13",
doi = "10.1109/EDSSC.2014.7061199",
language = "英语",
series = "2014 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2014",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2014 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2014",
address = "美国",
}