TY - JOUR
T1 - MoSe2 visible-light photocatalyst for organic pollutant degradation and Cr(VI) reduction
AU - Chu, Haipeng
AU - Lei, Wenyan
AU - Liu, Xinjuan
AU - Qu, Jiahui
AU - Li, Jinliang
AU - Zhu, Guang
AU - Niu, Lengyuan
AU - Pan, Likun
N1 - Publisher Copyright:
© 2016, Springer Science+Business Media New York.
PY - 2016/5/1
Y1 - 2016/5/1
N2 - A fast microwave-assisted approach was developed to fabricate MoSe2 via a reaction of MoSe2 precursor in an aqueous solution using a microwave system. The morphology, structure and photocatalytic activity were characterized by scanning electron microscopy, X-ray diffraction, X-ray photoelectron spectroscopy, UV–Vis absorption spectroscopy, and electrochemical impedance spectra, respectively. Results show that the MoSe2 synthesized at pH value of five exhibits a maximum methylene blue degradation rate of 90 % and Cr(VI) reduction rate of 95 % under visible light irradiation, which is attributed to the synergetic effect of MoSe2 particles that suppress the rate of charge recombination and increase the number of active adsorption sites. The excellent photocatalytic activity makes the MoSe2 a promising candidate for environmental engineering applications.
AB - A fast microwave-assisted approach was developed to fabricate MoSe2 via a reaction of MoSe2 precursor in an aqueous solution using a microwave system. The morphology, structure and photocatalytic activity were characterized by scanning electron microscopy, X-ray diffraction, X-ray photoelectron spectroscopy, UV–Vis absorption spectroscopy, and electrochemical impedance spectra, respectively. Results show that the MoSe2 synthesized at pH value of five exhibits a maximum methylene blue degradation rate of 90 % and Cr(VI) reduction rate of 95 % under visible light irradiation, which is attributed to the synergetic effect of MoSe2 particles that suppress the rate of charge recombination and increase the number of active adsorption sites. The excellent photocatalytic activity makes the MoSe2 a promising candidate for environmental engineering applications.
UR - https://www.scopus.com/pages/publications/84957547755
U2 - 10.1007/s10854-016-4453-1
DO - 10.1007/s10854-016-4453-1
M3 - 文章
AN - SCOPUS:84957547755
SN - 0957-4522
VL - 27
SP - 5483
EP - 5489
JO - Journal of Materials Science: Materials in Electronics
JF - Journal of Materials Science: Materials in Electronics
IS - 5
ER -