Morphology investigation of Hg1-xCdxTe liquid phase epitaxial films

Biao Li; J. H. Chu; J. Q. Zhu; X. Q. Chen; J. Y. Cao; D. Y. Tang

doi:10.1016/0022-0248(95)00998-1

Morphology investigation of Hg_1-xCd_xTe liquid phase epitaxial films

Biao Li^*
, J. H. Chu
, J. Q. Zhu
, X. Q. Chen
, J. Y. Cao
, D. Y. Tang

^*此作品的通讯作者

CAS - Shanghai Institute of Technical Physics

科研成果: 期刊稿件 › 文章 › 同行评审

4 引用（Scopus）

摘要

Scanning electron microscopy (SEM), energy dispersive analysis of X-ray (EDAX) and optical microscopy were used to investigate Hg_1-xCd_xTe liquid phase epitaxial (LPE) films. The results show that a quality substrate with critical misorientation and appreciable growth method can improve the surface morphology.

源语言	英语
页（从-至）	348-352
页数	5
期刊	Journal of Crystal Growth
卷	163
期	4
DOI	https://doi.org/10.1016/0022-0248(95)00998-1
出版状态	已出版 - 6月 1996
已对外发布	是

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10.1016/0022-0248(95)00998-1

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@article{3c37e5f688f34ee091bf0a7d83492d02,

title = "Morphology investigation of Hg1-xCdxTe liquid phase epitaxial films",

abstract = "Scanning electron microscopy (SEM), energy dispersive analysis of X-ray (EDAX) and optical microscopy were used to investigate Hg1-xCdxTe liquid phase epitaxial (LPE) films. The results show that a quality substrate with critical misorientation and appreciable growth method can improve the surface morphology.",

author = "Biao Li and Chu, \{J. H.\} and Zhu, \{J. Q.\} and Chen, \{X. Q.\} and Cao, \{J. Y.\} and Tang, \{D. Y.\}",

year = "1996",

month = jun,

doi = "10.1016/0022-0248(95)00998-1",

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T1 - Morphology investigation of Hg1-xCdxTe liquid phase epitaxial films

AU - Li, Biao

AU - Chu, J. H.

AU - Zhu, J. Q.

AU - Chen, X. Q.

AU - Cao, J. Y.

AU - Tang, D. Y.

PY - 1996/6

Y1 - 1996/6

N2 - Scanning electron microscopy (SEM), energy dispersive analysis of X-ray (EDAX) and optical microscopy were used to investigate Hg1-xCdxTe liquid phase epitaxial (LPE) films. The results show that a quality substrate with critical misorientation and appreciable growth method can improve the surface morphology.

AB - Scanning electron microscopy (SEM), energy dispersive analysis of X-ray (EDAX) and optical microscopy were used to investigate Hg1-xCdxTe liquid phase epitaxial (LPE) films. The results show that a quality substrate with critical misorientation and appreciable growth method can improve the surface morphology.

UR - https://www.scopus.com/pages/publications/0030564070

U2 - 10.1016/0022-0248(95)00998-1

DO - 10.1016/0022-0248(95)00998-1

M3 - 文章

AN - SCOPUS:0030564070

SN - 0022-0248

VL - 163

SP - 348

EP - 352

JO - Journal of Crystal Growth

JF - Journal of Crystal Growth

IS - 4

ER -

Morphology investigation of Hg1-xCdxTe liquid phase epitaxial films

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Morphology investigation of Hg_1-xCd_xTe liquid phase epitaxial films