摘要
Shallow levels in arsenic-doped Hg1-x Cdx Te grown by molecular beam epitaxy have been investigated by temperature- and excitation power-dependent modulated photoluminescence spectroscopy. The ionization energies of the shallow levels of AsTe, AsHg, and the AsHg - VHg complex are preliminarily determined to be about 11.0, 8.5, and 33.5 meV, respectively. Correspondingly, the forming energy of the AsHg - VHg complex has been deduced to be approximately 10.5 meV. The results could be used as guidelines for the material growth or the fabrication of related devices.
| 源语言 | 英语 |
|---|---|
| 文章编号 | 121916 |
| 期刊 | Applied Physics Letters |
| 卷 | 92 |
| 期 | 12 |
| DOI | |
| 出版状态 | 已出版 - 2008 |
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探究 'Modulated photoluminescence of shallow levels in arsenic-doped Hg 1-xCdxTe (x≈0.3) grown by molecular beam epitaxy' 的科研主题。它们共同构成独一无二的指纹。引用此
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