摘要
The concentrations and mobilities of bulk electron, bulk hole and interface electron were obtained, respectively, by the mobility spectrum analysis (MSA) for n-type HgCdTe film grown by MBE and LPE techniques. The changes of concentration and mobility for bulk and interface electrons versus temperature were also derived from the MSA, which agrees well with the theoretical analysis.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 327-332 |
| 页数 | 6 |
| 期刊 | Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves |
| 卷 | 17 |
| 期 | 5 |
| 出版状态 | 已出版 - 1998 |
| 已对外发布 | 是 |
指纹
探究 'Mobility spectrum analysis of multi-carrier system in HgCdTe' 的科研主题。它们共同构成独一无二的指纹。引用此
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