Microstructures and properties of the multiferroic Bi_xFeO ₃ thin films

The BixFeO3 thin films were grown on both Si and LaNiO3-coated Si substrates via sol-gel technique. The x-ray diffraction patterns were used to check the preliminary structures and crystallinities. The P-E curves which suggests the electrical characterizations of the films were analyzed. Furthermore, Raman spectra were also exploited to evaluate their optical properties.