Microstructure and electrical properties of textured Sr0.51Ba0.48La0.01Nb2O6 thin films

Z. Song; C. Lin; L. Wang; J. Huang; D. Hesse; N. D. Zakharov; H. Xu; M. Okuyama

doi:10.1007/s003390050059

Microstructure and electrical properties of textured Sr_0.51Ba_0.48La_0.01Nb₂O₆ thin films

Z. Song^*
, C. Lin
, L. Wang
, J. Huang
, D. Hesse
, N. D. Zakharov
, H. Xu
, M. Okuyama

^*此作品的通讯作者

CAS - Shanghai Institute of Microsystem and Information Technology
Max Planck Institute of Microstructure Physics
The University of Osaka

科研成果: 期刊稿件 › 文章 › 同行评审

4 引用（Scopus）

摘要

Sr_0.51Ba_0.48La_0.01Nb₂O₆ (SBLN) thin films were prepared on platinized silicon substrates by pulsed laser deposition (PLD) combined with annealing technique. The preferred orientation, surface morphology, composition, and interfacial properties of the SBLN thin films were characterized by X-ray diffraction, atomic force microscopy, transmission electron microscopy, X-ray energy dispersive spectroscopy, and automatic spreading resistance measurement. The ferroelectric properties were confirmed by P - E hysteresis loops. The frequency variation of the dielectric constant was measured as well.

源语言	英语
页（从-至）	355-358
页数	4
期刊	Applied Physics A: Materials Science and Processing
卷	70
期	3
DOI	https://doi.org/10.1007/s003390050059
出版状态	已出版 - 3月 2000
已对外发布	是

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title = "Microstructure and electrical properties of textured Sr0.51Ba0.48La0.01Nb2O6 thin films",

abstract = "Sr0.51Ba0.48La0.01Nb2O6 (SBLN) thin films were prepared on platinized silicon substrates by pulsed laser deposition (PLD) combined with annealing technique. The preferred orientation, surface morphology, composition, and interfacial properties of the SBLN thin films were characterized by X-ray diffraction, atomic force microscopy, transmission electron microscopy, X-ray energy dispersive spectroscopy, and automatic spreading resistance measurement. The ferroelectric properties were confirmed by P - E hysteresis loops. The frequency variation of the dielectric constant was measured as well.",

author = "Z. Song and C. Lin and L. Wang and J. Huang and D. Hesse and Zakharov, \{N. D.\} and H. Xu and M. Okuyama",

year = "2000",

month = mar,

doi = "10.1007/s003390050059",

language = "英语",

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TY - JOUR

T1 - Microstructure and electrical properties of textured Sr0.51Ba0.48La0.01Nb2O6 thin films

AU - Song, Z.

AU - Lin, C.

AU - Wang, L.

AU - Huang, J.

AU - Hesse, D.

AU - Zakharov, N. D.

AU - Xu, H.

AU - Okuyama, M.

PY - 2000/3

Y1 - 2000/3

N2 - Sr0.51Ba0.48La0.01Nb2O6 (SBLN) thin films were prepared on platinized silicon substrates by pulsed laser deposition (PLD) combined with annealing technique. The preferred orientation, surface morphology, composition, and interfacial properties of the SBLN thin films were characterized by X-ray diffraction, atomic force microscopy, transmission electron microscopy, X-ray energy dispersive spectroscopy, and automatic spreading resistance measurement. The ferroelectric properties were confirmed by P - E hysteresis loops. The frequency variation of the dielectric constant was measured as well.

AB - Sr0.51Ba0.48La0.01Nb2O6 (SBLN) thin films were prepared on platinized silicon substrates by pulsed laser deposition (PLD) combined with annealing technique. The preferred orientation, surface morphology, composition, and interfacial properties of the SBLN thin films were characterized by X-ray diffraction, atomic force microscopy, transmission electron microscopy, X-ray energy dispersive spectroscopy, and automatic spreading resistance measurement. The ferroelectric properties were confirmed by P - E hysteresis loops. The frequency variation of the dielectric constant was measured as well.

UR - https://www.scopus.com/pages/publications/0034155507

U2 - 10.1007/s003390050059

DO - 10.1007/s003390050059

M3 - 文章

AN - SCOPUS:0034155507

SN - 0947-8396

VL - 70

SP - 355

EP - 358

JO - Applied Physics A: Materials Science and Processing

JF - Applied Physics A: Materials Science and Processing

IS - 3

ER -

Microstructure and electrical properties of textured Sr0.51Ba0.48La0.01Nb2O6 thin films

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Microstructure and electrical properties of textured Sr_0.51Ba_0.48La_0.01Nb₂O₆ thin films