@inproceedings{8f69ae3fcd80497bad284942b6171600,
title = "Microscopic Characterization of Failure Mechanisms in Long-Term Implanted Microwire Neural Electrodes",
abstract = "The development of integrated circuits greatly enhances brain-computer interface technology. The degradation of the implanted neural electrodes is a key issue. The scanning electron microscope and energy dispersive spectrometer techniques are used to characterize the evolution of the microscopic morphology and element migration of implanted microwire electrodes containing 32 channels together with the recorded neural signals at different implantation times. The spike amplitude decreases over time of implantation, leading to poorer identification of neural signals. The effect of degradation on the local field potential detection is neglectable. This work could guide the reliability improvement of the neural electrodes.",
keywords = "Electron Microscope, Failure Mechanism, Neural Electrode, Reliability",
author = "Zhang, \{Z. J.\} and Q. Li and Dong, \{Z. Y.\} and Wang, \{W. T.\} and Lai, \{S. T.\} and X. Yang and F. Liang and Wang, \{C. L.\} and C. Luo and Lyu, \{L. J.\} and Z. Li and Xu, \{J. M.\} and X. Wu",
note = "Publisher Copyright: {\textcopyright} 2023 IEEE.; 61st IEEE International Reliability Physics Symposium, IRPS 2023 ; Conference date: 26-03-2023 Through 30-03-2023",
year = "2023",
doi = "10.1109/IRPS48203.2023.10117971",
language = "英语",
series = "IEEE International Reliability Physics Symposium Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2023 IEEE International Reliability Physics Symposium, IRPS 2023 - Proceedings",
address = "美国",
}