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Machine-Learning Based Nonlinerity Correction for Coarse-Fine SAR-TDC Hybrid ADC

  • University of Houston

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

This paper presents a backend machine learningbased nonlinearity calibration scheme for a coarse-fine two stage SAR-TDC hybrid ADC. Different from conventional approaches, the machine learning-based nonlinearity calibration scheme avoids the on-chip pseudonumber (PN) generator or complex, specific matrix operations in the digital domain backend process. The scheme utilizes a two-layer neural network to extract and compensate the bit-weight error caused by circuit nonlinearities such as inter-stage gain error or time-to-digital converter (TDC) delay cell mismatch. The neural network uses the ADC DNL and INL testing results as training data, thus avoiding additional reference channel or a split ADC structure. A 10-bit 500 MS/s coarse-fine SAR-TDC ADC is designed in 22nm FDSOI technology to validate the scheme. The simulation results show the ADC achieves an SNDR of 57 dB, SFDR of 71.3 dB, and an ENOB of 9.18 bits, corresponding to a Walden FOM of 5.2 fJ/conv.-step after backend nonlinearity calibration.

源语言英语
主期刊名2020 IEEE 63rd International Midwest Symposium on Circuits and Systems, MWSCAS 2020 - Proceedings
出版商Institute of Electrical and Electronics Engineers Inc.
265-268
页数4
ISBN(电子版)9781538629161
DOI
出版状态已出版 - 8月 2020
活动63rd IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2020 - Springfield, 美国
期限: 9 8月 202012 8月 2020

出版系列

姓名Midwest Symposium on Circuits and Systems
2020-August
ISSN(印刷版)1548-3746

会议

会议63rd IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2020
国家/地区美国
Springfield
时期9/08/2012/08/20

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