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Low temperature electrical transport properties of F-doped SnO2 films

  • K. H. Gao*
  • , T. Lin
  • , X. D. Liu
  • , X. H. Zhang
  • , X. N. Li
  • , J. Wu
  • , Y. F. Liu
  • , X. F. Wang
  • , Y. W. Chen
  • , B. Ni
  • , N. Dai
  • , J. H. Chu
  • *此作品的通讯作者
  • Tianjin University
  • East China Normal University
  • CAS - Shanghai Institute of Technical Physics
  • Hebei University of Technology
  • CAS - Shanghai Institute of Ceramics

科研成果: 期刊稿件文章同行评审

摘要

We study the electrical transport properties of F-doped SnO2 thin films in a temperature range from 12 to 300 K. Two samples exhibit metallic characteristics in high temperature ranges, where the phonon-dominated scattering is the main conduction mechanism. In the low temperature range below 60 K, the negative magnetoresistivity resulting from the weak localization effect is observed. Applying weak-localization theory, we have obtained the inelastic scattering time. The obtained inelastic scattering time is proportional to T-3, indicating that the electron-phonon interaction is main dephasing mechanism for electrons.

源语言英语
页(从-至)49-53
页数5
期刊Solid State Communications
157
DOI
出版状态已出版 - 3月 2013

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