摘要
InAlAs/InGaAs metamorphic high-electron-mobility transistor structures with different spacer layers on GaAs substrates are characterized by Raman measurements. The influence of In0.52Al0.48As spacer thickness on longitudinal optic phonon-plasmon coupling is investigated. It is found that the intensity of GaAs-like longitudinal optic phonon, which couples with collective intersubband transitions of two-dimensional electron gas, is strongly affected by the different subband energy spacings, subband electron concentrations, and wave function distributions, which are determined by different spacer thicknesses.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 1375-1377 |
| 页数 | 3 |
| 期刊 | Applied Physics Letters |
| 卷 | 79 |
| 期 | 9 |
| DOI | |
| 出版状态 | 已出版 - 27 8月 2001 |
| 已对外发布 | 是 |
指纹
探究 'Longitudinal optic phonon-plasmon coupling in δ-doped metamorphic InAlAs/InGaAs high-electron-mobility transistor structures on GaAs substrates' 的科研主题。它们共同构成独一无二的指纹。引用此
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